Controlling Autocorrelated Process with Multiple Sources of Variation
碩士 === 國立交通大學 === 工業工程與管理系所 === 97 === Statistical Process Control (SPC) has been widely employed in many industries, especially in high-tech manufacturing. In SPC, the X-BAR control chart is generally implemented in wafer manufacturing and it is designed to monitor the quality of product data for s...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/90879396623488575689 |