The Studies of Porous Low-k SiOCH Materials

博士 === 國立成功大學 === 微電子工程研究所碩博士班 === 97 === As ultra large scale integrated (ULSI) circuits shrink to sub-micron dimensions, the interconnect widths become smaller; therefore, signal propagation delays become a dominant part of the overall chip delay. Crosstalk and power consumption greatly increase d...

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Bibliographic Details
Main Authors: Chun-Hsien Huang, 黃俊憲
Other Authors: Mau-Phon Houng
Format: Others
Language:en_US
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/47399889790398323029