Investigations on The RF Performances of Deep Submicron CMOS Devices with a Developed Automatic Test System
博士 === 國立成功大學 === 微電子工程研究所碩博士班 === 97 === In this dissertation, an automatic RF test system, updated from a manual RF bench tester, has been developed with the advantages of accuracy and time saving. Compared with the commercially automatic RF test systems, the developed system has lower cost with t...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/25639955803694779384 |