The Improvement of Reliability of High-k/Metal Gate pMOSFET Device with Various PMA Conditions

by Yi-Lin Yang, Wenqi Zhang, Chi-Yun Cheng, Wen-kuan Yeh
Published 2012-01-01

Multiple-valued logic design based on the multiple-peak BiCMOS-NDR circuits

by Kwang-Jow Gan, Jeng-Jong Lu, Wen-Kuan Yeh, Yaw-Hwang Chen, Yan-Wun Chen
Published 2016-06-01

Modifying Threshold Voltages to n- and p- Type FinFETs by Work Function Metal Stacks

by Wen-Teng Chang, Meng-His Li, Chun-Hao Hsu, Wen-Chin Lin, Wen-Kuan Yeh
Published 2021-01-01

Single-Grain Gate-All-Around Si Nanowire FET Using Low-Thermal-Budget Processes for Monolithic Three-Dimensional Integrated Circuits

by Tung-Ying Hsieh, Ping-Yi Hsieh, Chih-Chao Yang, Chang-Hong Shen, Jia-Min Shieh, Wen-Kuan Yeh, Meng-Chyi Wu
Published 2020-07-01

Ge GAA FETs and TMD FinFETs for the Applications Beyond Si—A Review

by Yao-Jen Lee, Guang-Li Luo, Fu-Ju Hou, Min-Cheng Chen, Chih-Chao Yang, Chang-Hong Shen, Wen-Fa Wu, Jia-Min Shieh, Wen-Kuan Yeh
Published 2016-01-01

AlN Surface Passivation of GaN-Based High Electron Mobility Transistors by Plasma-Enhanced Atomic Layer Deposition

by An-Jye Tzou, Kuo-Hsiung Chu, I-Feng Lin, Erik Østreng, Yung-Sheng Fang, Xiao-Peng Wu, Bo-Wei Wu, Chang-Hong Shen, Jia-Ming Shieh, Wen-Kuan Yeh, Chun-Yen Chang, Hao-Chung Kuo
Published 2017-04-01

Using Capacitance Sensor to Extract Characteristic Signals of Dozing from Skin Surface

by Po-Ying Chen, Chi-Chang Chen, Wen-Kuan Yeh, Yukan Chang, Der-Chen Huang, Shyr-Shen Yu, Chwei-Shyong Tsai, Yu-Jung Huang, Wei-Cheng Lin, Shao-I Chu, Chung-Long Pan, Tsung-Hung Lin, Shyh-Chang Liu
Published 2014-01-01

CiM3D: Comparator-in-Memory Designs Using Monolithic 3-D Technology for Accelerating Data-Intensive Applications

by Akshay Krishna Ramanathan, Srivatsa Srinivasa Rangachar, Hariram Thirucherai Govindarajan, Je-Min Hung, Chun-Ying Lee, Cheng-Xin Xue, Sheng-Po Huang, Fu-Kuo Hsueh, Chang-Hong Shen, Jia-Min Shieh, Wen-Kuan Yeh, Mon-Shu Ho, Jack Sampson, Meng-Fan Chang, Vijaykrishnan Narayanan
Published 2021-01-01

The Device Performance and Reliability of Negative-bias Temperature Instability of multi-fin p-FinFET with Different Work Functions

by 林孟琰
Published 2019

The Investigation of Reliability Check for Palladium Copper Wire and Copper Wire

by Tzu-Hung Tseng, 曾子航
Published 2017

ILD Delam and Laser Grooving Analysis

by YU ZHAN ZHAO, 趙昱軒
Published 2017

Compression Molding Compound Study of Thin Package Development for DRAM Application

by YU-SUNG LIN, 林育嵩
Published 2017

Construction of an Improved Genetic Algorithm Applied to the Separation System of Skin Auto-Fluorescence Spectra

by Li-Wu Lin, 林立武

The Study of High-k/Metal Gate CMOSFET with Various Post Treatments

by Chi-Yun Cheng, 鄭濟允
Published 2011

The Studies of Indium-Halo Implantation and CESL (Contact Etch Stop Layer) Strain Engineering on 90 nm CMOSFETs with Different Gate Structures

by Chien-Ming Lai, 賴建銘
Published 2007

Influence of Characteristic and Reliability on UTBB SOI nMOSFETs with different Temperature

by Chien-hung Yeh, 葉建宏
Published 2014

The analysis and modeling of advanced MOSFET and passive component

by Chia-Wei Hsu, 許家維
Published 2007

The Investigations of Negative Bias Temperature Instability on P-MOSFETs with High-k Dielectrics in 90nm Technology

by Shau-hua Syu, 徐韶華
Published 2007

Measurement, Analysis, and Simulation of High Frequency Embedded Passive Devices Before and After Packaging

by Endruw Jahja, 陶恩路
Published 2007

An Efficient CMOS VCO Design with Low-Phase-Noise and High Tuning Range for RF System

by Kung-Chung Lu, 盧貫中
Published 2006