Research on Material Properties of SiGe Epitaxial Thin Film and Fabrication of SiGe Nanostructures

博士 === 國立中興大學 === 機械工程學系所 === 97 === This study presents the variations of material properties of SiGe epitaxial thin films at different annealing temperatures. The SiGe samples were deposited by ultrahigh vacuum chemical vapor deposition (UHVCVD) system. Various techniques, including high-resolutio...

Full description

Bibliographic Details
Main Authors: Yuan-Ming Chang, 張原銘
Other Authors: Ching-Liang Dai
Format: Others
Language:en_US
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/95248313592298176597