The Study of Controlling ArF Excimer Laser

碩士 === 明新科技大學 === 電機工程研究所 === 97 === This study aims at the application of 193nm ArF Excimer Laser in the photolithography process in semiconductor processes since FWHM, or Full Width at Half Maximum, and E95% are vitaly influential on semiconductor processes. In particular, the semiconductor proces...

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Bibliographic Details
Main Author: 鄭東明
Other Authors: 林振義
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/21700667312567070487