Investigation of Degradation Mechanism of CLC n-TFTs under High Field and Temperature Stress
碩士 === 明新科技大學 === 電子工程研究所 === 97 === Recently, low-temperature polycrystalline silicon thin-film transistors (LTPS TFTs) have been the trend of active matrix display driving circuitry. These devices unavoidably show more serious degradation of device performance in BTI (BTI) stress than in hot-carri...
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| Format: | Others |
| Language: | zh-TW |
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2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/87489852698582973634 |