Application for semiconductor assembly product by ultrasonic

碩士 === 國立高雄應用科技大學 === 電子工程系 === 97 === In early periods the electronic assembly product evolution is improved from PDIP、QFP、BGA to FCBGA and CSP. In manufacture production to ensure process variation could be detect and control immediately some of destructive/non-destructive inspection/test/measurem...

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Bibliographic Details
Main Authors: Wen-Long Wang, 王文龍
Other Authors: Maw-Shung Lee
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/81516412698144100748