The Characterization of Aluminum Fluoride Thin Films for DUV Application

碩士 === 輔仁大學 === 物理學系 === 97 === A novel and effective process to fabricate high quality fluoride thin films was presented. Aluminum fluoride films deposited by a conventional thermal evaporation at around room temperature with IAD using SF6 as a working gas were investigated. In this study, the opti...

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Bibliographic Details
Main Authors: Chi-Ren Liu, 劉吉仁
Other Authors: Jin-Cherng Hsu
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/50798548143398276412