CONSTRUCT PREDICTION MODEL OF THE ABNORMAL DEFECT BY ANALYZING ELECTRIC CHARACTER ON ARRAY’S PROCESS
碩士 === 元智大學 === 工業工程與管理學系 === 96 === It has highly correlation between TEG(Test Element Group) electric measure value on Array’s process and Array NG Rank what is abnormal defect on Cell’s process. The panel be judged as Array NG Rank 4 will be scrapped.It can reduce the cost waste resulted from u...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/35562779819998266713 |