Application of machine vision for color filter surface defect inspection
碩士 === 元智大學 === 工業工程與管理學系 === 96 === The color filer (CF) is a key component for manufacturing TFT-LCD’s. Micro-defects are generally very small and cannot be easily detected by operators. This study proposes an automatic visual inspection method for defect detection, and especially focus on micro-d...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/63741334500749360719 |