Improvement of Against Oxidation and Electrical Properties of Passivated Cu(Hf) Thin Film

碩士 === 國立虎尾科技大學 === 材料科學與綠色能源工程研究所 === 96 === In this study, the characteristics of Cu(Hf) alloy thin films and its applications as the materials of interconnect were investigation. Driven by copper has much lower electrical resistivity and higher electron migration (EM) resistance than that of alum...

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Bibliographic Details
Main Authors: Yu-Tzu Chen, 陳佑慈
Other Authors: 方昭訓
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/5vhzmm

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