Simulation of SiGe Stacked in Tunneling Layer and Charge Distribution of High-K Charge Trapping Layer in Charge-Trap Flash Device

碩士 === 國立清華大學 === 工程與系統科學系 === 96 ===

Bibliographic Details
Main Authors: Zong-Hao Ye, 葉宗浩
Other Authors: Kuei-Shu Chang-Liao
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/17581422419216505974