Wireless Interface Design for HOY: An Emerging Test Platform
碩士 === 國立清華大學 === 電機工程學系 === 96 === Conventional testing scheme for a chip utilizes probes or sockets between Automatic Test Equipment (ATE) and Device Under Test (DUT), which will cost a lot and damage I/O pads in wafer easily. To improve the quality of chip testing, some advanced testing technolog...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/00355398767574467959 |