A Low Power Test Compression Scheme- Cool Universal Multi-Casting Scan(CUMC-Scan)
碩士 === 國立清華大學 === 電機工程學系 === 96 === We present a scan test methodology – called Cool Universal Multicasting Scan (CUMC-Scan) for not only compressing test data volume but also reducing scan test power. Combining the universal segmented shifting and multi-testing based partial capture, it is the firs...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/66195093097443895425 |