The Fabrication and Characterization of Metal (Al)-Oxide-Si Capacitors and Field-effect Transistors Using LaAlO3 Gate dielectric

碩士 === 國立清華大學 === 電子工程研究所 === 96 ===

Bibliographic Details
Main Authors: Sheng-Wen You, 尤聖文
Other Authors: Ya-Min Lee
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/45268420590822138824