Comprehensive Evaluations of Three-Dimensional Electromagnetic Field Simulation Software for Accurate Nanometer Device Modeling

碩士 === 國立清華大學 === 資訊工程學系 === 96 === With the advancement of process technologies, the dimension of BEoL (Back End of the Production Line) interconnect has become smaller and smaller. Therefore, it will reveal many issues and challenges unceasingly that need to be concerned than before. One of them i...

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Bibliographic Details
Main Authors: Wei-Sheng Fei, 費維声
Other Authors: Keh-Jeng Chang
Format: Others
Language:zh-TW
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/30185265160312263513