Spring Constant of Atomic Force Microscope Cantilevers and Mechanical Property Measurement of Carbon Nanotubes
博士 === 國立清華大學 === 動力機械工程學系 === 96 === Abstract Atomic force microscope (AFM) has many applications in science research under nano-scale or micro-scale. The mechanical properties of nanostructures can be measured from the deformation of cantilever of atomic force microscope. The accuracy of the m...
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| Format: | Others |
| Language: | en_US |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/66556183366283442873 |