Water-assisted Liquid Phase Deposited Fluorinated Silicon Oxide on Amorphous Silicon

碩士 === 國立中山大學 === 電機工程學系研究所 === 96 === In this study, SiO2-xFx films were deposited on Si and amorphous silicon, their physical and chemical properties were measured. An Al/ SiO2-xFx /Si and Al/ SiO2-xFx/a-Si/Si MOS structures were used for the electrical measurements. To improve the electrical prop...

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Bibliographic Details
Main Authors: Chun-Wei Chia, 賈鈞偉
Other Authors: Ming-Kwei Lee
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/839m5f