X-Ray Diffraction Analysis of Mosaic Structure
碩士 === 國立彰化師範大學 === 電子工程學系 === 96 === The crystal quality of GaN and InN films grown on Si (111) substrate by molecular beam epitaxy have been evaluated by x-ray diffraction. Asymmetric rocking curves of different inclination angle between reciprocal lattice vector and surface normal, symmetric rock...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/71125232062426787595 |