Simplification of 2-D LFSR-Based Test Generators Using XOR Gates Sharing
碩士 === 國立彰化師範大學 === 資訊工程學系 === 96 === A Built-In-Self-Test (BIST) is one of most popular test solutions to test the embedded cores in a chip. The BIST circuit can generate pseudo random test patterns to test these embedded cores without using expensive Automatic Test Equipments. Its architecture ess...
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| Format: | Others |
| Language: | en_US |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/36241780485135702141 |