TFT-LCD Mura Defects Automatic Inspection system using Singular Value Decomposition and Optimal division method
碩士 === 國立中央大學 === 機械工程研究所 === 96 === With the development of technology, LCD(liquid crystal display) has become the core of displays nowadays. The quality of LCD is one of the targets making customers to purchase. To make sure the quality of LCD, defect detection plays an important role in this fi...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/33072174818377849690 |