Diagnosis Approaches for Multi-Core System Chips
碩士 === 國立中央大學 === 電機工程研究所 === 96 === Multi-core architecture with built-in self-test (BIST) has become a design trend for VLSI chips due to their needs of high performance and high reliability. Efficient approaches for diagnosing fail cores and scan chains thus are imperative for yield enhancement....
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| Format: | Others |
| Language: | en_US |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/08051130915702637681 |