Strain analysis of InN nanodots by Micro-Raman scattering

碩士 === 國立交通大學 === 電子物理系所 === 96 === In this thesis,we studied the realationsheep between the strain and the different size InN nano-dots by ��-Raman and X-ray diffraction(XRD). The Obvious shift of Raman E2 mode is observed with different size InN nano-dots. As the aspect ratio decreased, we found t...

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Bibliographic Details
Main Authors: Feng-Yi Lin, 林峰毅
Other Authors: 張文豪
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/6kkn58