Study on Split-Gate Non-Volatile Memory Technology and A Novel Single Poly EEPROM Memory Cell
博士 === 國立交通大學 === 電子工程系所 === 96 === In this thesis, first, we developed a new methodology for program vs disturb window characterization on split gate flash. This method can help us to understand quantitatively how the window shifts vs bias conditions; furthermore, find the optimal program condition...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2008
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/18357558614201823223 |