Reliability Oriented Multiple-Vth Assignment for Leakage Power Reduction

碩士 === 中原大學 === 電子工程研究所 === 96 === As process technology scales to nano-meter, the leakage power dissipation has become an important concern for low power design in VLSI. Dual threshold voltage assignment is a popular effective technique to reduce leakage power. In this paper, we propose novel effic...

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Bibliographic Details
Main Authors: Shih-Wei Wu, 吳世偉
Other Authors: Shih-Hsu Huang
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/12359601363349678785