Study of electrical and physical properties of high-k ytterbium oxide gate dielectrics
碩士 === 長庚大學 === 電子工程學研究所 === 96 === In this thesis, we selected three kinds of gas flow ratio first, deposited high-k ytterbium oxides (Yb2O3) as the metal-oxide-semiconductor capacitance gate dielectrics by reactive RF sputtering. Then performed post deposition O2 rapid thermal annealing treatment...
Main Authors: | Wei Shing Huang, 黃偉翔 |
---|---|
Other Authors: | T. M. Pan |
Format: | Others |
Published: |
2008
|
Online Access: | http://ndltd.ncl.edu.tw/handle/86948075492298994890 |
Similar Items
-
The Electrical and Structural Properties of Thulium Oxide, Thulium Titanium Oxide, Ytterbium Titanium Oxide, and Holmium Titanium Oxide Gate Dielectrics
by: Li Chen Yen, et al.
Published: (2009) -
Study of Ultrathin Gate Dielectric and High K Gate Dielectric for CMOS Technology
by: Jiann-Shing Lee, et al.
Published: (2002) -
The electrical characteristics and physical properties of lanthanum oxide and erbium oxide gate dielectrics for different metal gates
by: Chun-Lin Chen, et al.
Published: (2006) -
Effect of the Physical and Electrical Characteristics of Samarium Oxide Gate Dielectrics
by: Chun Chin Hung, et al.
Published: (2008) -
Electrical Properties and Reliability of Various High-k Gate Dielectric Stacks
by: Ming-Kai Shiau, et al.
Published: (2011)