CIRCUIT DESIGN TECHNIQUES FOR HIGH RELIABITY SUB-MICRON PROCESS SRAM
碩士 === 國立中正大學 === 電機工程所 === 96 === Monitoring the real-time temperature within a circuitry will save it from severe overheating circumstances. Single temperature sensor located on dies only monitors globally, which is not sufficient to achieve optimal power efficiency. Also, the corresponding coolin...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/86744968227847384307 |