Segmented Compression Technique for IP core by Scan Chain Partitioning
碩士 === 元智大學 === 資訊工程學系 === 95 === A new test data compression technique especially suitable for core level test of SoC testing is presented. The proposed method logically partitions the scan chain into four segments, and each segment is formed by the grouped scan cells according to 0’s, 1’s and X’s...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Online Access: | http://ndltd.ncl.edu.tw/handle/07917701235910360868 |
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