Adaptive Adjustment Scheme of Time-Varying Metrology Delay using RLS-type Controllers

碩士 === 元智大學 === 工業工程與管理學系 === 95 === RtR control technique has received tremendous interest, such as on-line quality control, in semiconductor manufacturing industry. The well-known methods are EWMA, dEWMA, and RLS controllers. It is often the case that a significant delay exists between a process r...

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Bibliographic Details
Main Authors: Le-Chun Lo, 羅仂君
Other Authors: Shu-Kai Fan
Format: Others
Language:en_US
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/08619127028657368353