Patent Map and Development Analysis for Integrated Passive Device
碩士 === 國立高雄大學 === 電機工程學系--先進電子構裝技術產業研發碩 === 95 === Patent map is a common method of the technology trend analysis method. Furthermore, the analysis of the patent concentrated and vacancy areas could design around the patent or create a new invention. In view of the advance of the semiconductor techn...
Main Authors: | Chih-nan Wei, 魏志男 |
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Other Authors: | Sung-mao Wu |
Format: | Others |
Language: | zh-TW |
Published: |
2007
|
Online Access: | http://ndltd.ncl.edu.tw/handle/18880782076678304856 |
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