Patent Map and Development Analysis for Integrated Passive Device

碩士 === 國立高雄大學 === 電機工程學系--先進電子構裝技術產業研發碩 === 95 === Patent map is a common method of the technology trend analysis method. Furthermore, the analysis of the patent concentrated and vacancy areas could design around the patent or create a new invention. In view of the advance of the semiconductor techn...

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Bibliographic Details
Main Authors: Chih-nan Wei, 魏志男
Other Authors: Sung-mao Wu
Format: Others
Language:zh-TW
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/18880782076678304856