IEEE 1500 Compatible Test Wrapper Design and Validation for At-Speed Delay Testing
碩士 === 國立臺灣大學 === 電子工程學研究所 === 95 === In this thesis, two delay fault test methods are proposed,G1P2 and G2P2. G1P2 is a delay fault test method which may save test area and test time. G2P2 is a precise At-Speed delay fault test method. Our delay fault test methods would need some test points. A tes...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/29886330737705031897 |