Complemented Response Cell (CRC) : A Low Peak Power design for Testability Technique
碩士 === 國立臺灣大學 === 電子工程學研究所 === 95 === This thesis presents a novel low peak power DFT technique, called Complemented Response Cell (CRC), to reduce the peak power at the system clock. This technique controls the data input of specified scan cells such that their contents remain unchanged before and...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | en_US |
Published: |
2006
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Online Access: | http://ndltd.ncl.edu.tw/handle/82918884996417308323 |