A Study on Adopting RFID Technology to Model a Real-time Information Sharing System for Wafer Testing Center－The Case Study of C Wafer Testing Company
碩士 === 國立臺灣大學 === 商學組 === 95 === Responding to the trends of fast change of semiconductor technique, high competition and promoting customer''s satisfaction have already become the most important topics to semiconductor industry. In addition to manufacturing capability, providing customer&...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/07768112986231375931 |