The Study of Inductively Coupled Plasma etching of HfAlO Based MOSFET

碩士 === 國立清華大學 === 工程與系統科學系 === 95 === The etching properties of HfAlO, HfO2 and silicon wafer with pattern were investigated using inductively coupled high density plasma etcher. To develop plasma etch process of high dielectric gate oxide. The effects of the experimental parameters, including ICP p...

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Bibliographic Details
Main Authors: Chih-Wei Wang, 王智偉
Other Authors: Keh-Chyang Leou
Format: Others
Language:zh-TW
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/87984734859322402394