Resistance switching characteristics of TiO2 films deposited by MOCVD

碩士 === 國立清華大學 === 材料科學工程學系 === 95 === Abstract The TiO2 films for non-volatile memory applications were prepared on Pt bottom electrode by metal-organic chemical vapor deposition (MOCVD) method. The Pt top and bottom electrodes were made in symmetric metal-insulator-metal (MIM) structure. In order t...

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Bibliographic Details
Main Authors: Ying-Ching Chang, 張櫻靖
Other Authors: Tai-Bor Wu
Format: Others
Language:en_US
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/50136431506004967889