Reliability and Degradation Mechanism of Polysilicon Thin-Film Transistor
碩士 === 國立中山大學 === 電機工程學系研究所 === 95 === In this thesis, we will investigate the degradation of the Low-Temperature-Polycrystalline-Silicon TFTs(LTPS TFTS) under the electrical stress. The devices are offer by Chi Mei Optoelectronics. The two mechanisms of the electrical stress are ac and dc stress. O...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/43rn86 |