Functional Imaging of GaP LED With Two-Photon DC and RF OBIC
碩士 === 國立中山大學 === 光電工程研究所 === 95 === The techniques of optical beam induced current (OBIC) have found wide-spread applications in characterizing many semiconductor and optoelectronic devices. A two-photon confocal microscope is adapted for investigating the dynamics of light emitting devices through...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/549bh7 |