Stress induced wavelength shift of thin WDM thin film filter

碩士 === 國立中山大學 === 光電工程研究所 === 95 === Stress induced wavelength shift of thin film filter (TFF) were investigated. The substrate thickness of the TFF were greatly reduced by lapping to enhance the effects of stress. For CWDM TFF, no significant wavelength shift was observed by reducing their substrat...

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Bibliographic Details
Main Authors: Jr-hau Jiang, 姜智豪
Other Authors: Ann-Kuo Chu
Format: Others
Language:zh-TW
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/9j4mxq