Investigation of Self-Heating and Reliability Issues in Lateral DMOS by Using an Additional Metal Contact Structure

碩士 === 國立交通大學 === 電子工程系所 === 95 === Lateral Double-Diffused MOS (LDMOS) have been widely utilized in power electronics, for example, LCD drivers, power switch, and ratio frequency power transistor in high voltage integrated circuits. In this study, we will characterize the self-heating and hot carri...

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Bibliographic Details
Main Authors: Jia-Fu Lin, 林家福
Other Authors: Tahui Wang
Format: Others
Language:en_US
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/30540774293900727083