Investigation of Reliability Issues in Nitride Trap Storage Flash Memory
博士 === 國立交通大學 === 電子工程系所 === 95 === This thesis will focus on the reliability issues of SONOS-type trapping storage flash memories. For today’s SONOS cells, a thicker bottom oxide is employed to improve the retentivity. These cells exhibit excellent data retention behavior before stress. After P/E c...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/91462856739306168593 |