Design and Analysis of Efficient Scan Chain Architecture for Improving Code-Based Test Data Compression

碩士 === 中興大學 === 資訊科學系所 === 95 ===

Bibliographic Details
Main Authors: Shih-Cheng Chen, 陳世政
Other Authors: Sying-Jyan Wang
Format: Others
Language:zh-TW
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/97807109296453983104