A Study of Improving Detection Ability of a-Si Residue on TFT Testing
碩士 === 國立中興大學 === 機械工程學系所 === 95 === There are some LCD TFT testing methods on ARRAY site such as testing of pixel electric saving、testing of pixel electric optic、pixel electrical testing of E-beam. Nowadays, because of amorphous silicon residue can not be detected effectively by these kinds of elec...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/11438794810192959642 |