The Applications of Memory Algorithms: Real Case Studies

碩士 === 義守大學 === 電子工程學系半導體暨封裝測試產業研發碩士 === 95 === This research is based on the premise to improve the product test in current testing house.The basic test theory including DC test, functional test, AC test and test equipment is described in detail in this work. Furthermore, a brief introduction of t...

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Bibliographic Details
Main Authors: Yung-Mao Lin, 林永茂
Other Authors: Yu-Jung Huang
Format: Others
Language:zh-TW
Online Access:http://ndltd.ncl.edu.tw/handle/03147795289131640128