Stability Analysis of Micro Electromechanical Structures

碩士 === 華梵大學 === 機電工程研究所 === 95 === This paper presents a novel and high-precision algorithm and method for stability analysis of micro electromechanical structures. The contents are extracting the Young’s modulus and residual stress of thin films through the pull-in voltage of the micro test-key at...

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Bibliographic Details
Main Authors: Shun-Sheng Chen, 陳舜昇
Other Authors: Yuh-Chung Hu
Format: Others
Language:zh-TW
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/96658699623675165542