Defect Detection of PCB Assembly with Statistics Method
碩士 === 輔仁大學 === 電子工程學系 === 95 === To develop a visual inspection system using inexpensive CMOS Sensor is the purpose of this study. It is used to replace the vision inspection process in the mass production of electronic product on the detection of feature point. The detection method used here is im...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/30551292774779713498 |