Surface Defect Detection and Classification for Coating Brightness Enhancement Film in Liquid Crystal Display
碩士 === 國立臺北科技大學 === 工業工程與管理系所 === 94 === This paper develops an automatic optical inspection (AOI) system to inspect the surface defects such as Mura, bubble, streak, and contamination on Coating Brightness Enhancement Film (BEF). At first, using histogram equalization and local statistic parameter...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/nxhjut |