Measurements of Interface Traps and Depth Profiling of Border Traps in MOSFETs with High-K Gate Dielectrics

Measurements of Interface Traps and Depth Profiling of Border Traps in MOSFETs with High-K Gate Dielectrics

碩士 === 國立清華大學 === 工程與系統科學系 === 94 ===

Bibliographic Details
Main Authors:	Chen-Hao Huang, 黃振浩
Other Authors:	Kuei-Shu Chang-Liao
Format:	Others
Language:	zh-TW
Published:	2006
Online Access:	http://ndltd.ncl.edu.tw/handle/78667355420538205419

Description
Summary:	碩士 === 國立清華大學 === 工程與系統科學系 === 94 ===