相變化記憶胞之模擬研究

碩士 === 國立清華大學 === 材料科學工程學系 === 94 === Phase-change random access memory is considered a potential challenger for conventional memories,Nevertheless,high reset current is the ultimate problem in developing high-density phase-change random access memory(PRAM). Therefore, Phase-change memory cell with...

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Bibliographic Details
Main Authors: Jung-Tso Sun, 孫榮佐
Other Authors: Lih-Hsin Chou
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/90991750203302400552